Reactive-ion etching

Results: 96



#Item
61Technology / Microelectromechanical systems / Etching / Wafer / Photoresist / Stepper / Deep reactive-ion etching / Cleanroom / Applied Materials / Semiconductor device fabrication / Materials science / Microtechnology

Fraunhofer IMS F RAU N HOF E R I NST I T U T E F O R M IC RO E L EC T RO N I C C I RCU I T S A N D SYS T E MS I MS

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Source URL: www.ims.fraunhofer.de

Language: English - Date: 2014-02-15 05:02:23
62Science / Etching / Reactive-ion etching / MIMOS / Photolithography / Statistical process control / Wafer fabrication / Wafer testing / Metrology / Semiconductor device fabrication / Technology / Materials science

MIMOS Semiconductor Training – Detail Training Content No Type

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Source URL: semicon.mimos.my

Language: English - Date: 2013-06-12 03:17:26
63Microtechnology / Microelectromechanical systems / Wafer / Chemical vapor deposition / Deep reactive-ion etching / Stepper / Reactive-ion etching / Plasma etcher / Sputtering / Semiconductor device fabrication / Materials science / Technology

Marvell NanoLab Member login Lab Manual Contents

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Source URL: nanolab.berkeley.edu

Language: English - Date: 2012-11-20 13:15:45
64Technology / Microtechnology / Ceramic materials / Etching / Silicon carbide / Reactive-ion etching / Doping / Sulfur hexafluoride / Microelectromechanical systems / Semiconductor device fabrication / Materials science / Chemistry

Concept Demonstration of Dopant Selective Reactive Etching in Silicon Carbide Investigator(s): Dr. Robert S. Okojie (PI)/RHS at NASA GRC, Dorothy Lukco/Vantage Partners, LLC. At NASA GRC, and Laura Evans/RXS at NASA GRC

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Source URL: nari.arc.nasa.gov

Language: English - Date: 2014-10-17 18:20:41
65Technology / Microtechnology / Etching / Reactive-ion etching / NASA / Silicon carbide / Materials science / Semiconductor device fabrication / Chemistry

NASA Aeronautics Research Institute Concept Demonstration of Dopant Selective Reactive Etching (DSRIE) in Silicon Carbide Robert S. Okojie, PhD

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Source URL: nari.arc.nasa.gov

Language: English - Date: 2014-10-17 18:19:56
66Materials science / Microtechnology / Vapour phase decomposition / Wafer / X-ray fluorescence / Photolithography / Thermal oxidation / Inductively coupled plasma mass spectrometry / Deep reactive-ion etching / Semiconductor device fabrication / Chemistry / Science

Analytical Techniques for Trace Elemental Analyses on Wafer Surfaces for Monitoring and Controlling Contamination J. Wang, M. K. Balazs Balazs Analytical Laboratory, Sunnyvale, CA[removed]P. Pianetta, K. Baur and S. Brenna

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Source URL: www-project.slac.stanford.edu

Language: English - Date: 2003-04-14 02:31:05
67Technology / Microelectromechanical systems / Microfabrication / Micro-Opto-Electro-Mechanical Systems / Deep reactive-ion etching / Etching / Photolithography / Graphene / Bulk micromachining / Materials science / Microtechnology / Semiconductor device fabrication

1– 6 February Technical Summaries www.spie.org/pw Conferences and Courses

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Source URL: spie.org

Language: English - Date: 2014-10-28 11:09:21
68Pump / Double-click / GUI widget / Elevator / Plasma etching / System software / Software / Technology / Semiconductor device fabrication / Plasma processing / Reactive-ion etching

Unaxis 790 Series RIE Metal Fluorine Plasma Processing System Users Manual Coral name: Model:

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Source URL: www.nist.gov

Language: English - Date: 2013-01-18 08:44:58
69Semiconductor device fabrication / Glass physics / Nanotechnology / Etching / Microelectromechanical systems / Deep reactive-ion etching / Nanoelectromechanical system / Fracture / Focused ion beam / Materials science / Chemistry / Microtechnology

Nanoscale Strength Measurements and Standards Objective Impact and Customers • The MEMS industry currently generates revenues of about $45B/year, dominated by two non-contact devices: inkjet

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Source URL: www.nist.gov

Language: English - Date: 2012-10-04 11:43:10
70Manufacturing / 10 micrometres / Wafer / Microsphere / Deep reactive-ion etching / Particle size / Silicon carbide / Nanoparticle / Chemistry / Materials science / Semiconductor device fabrication

GENESIS CONCENTRATOR TARGET PARTICLE CONTAMINATION MAPPING AND MATERIAL IDENTIFICATION Michael J. Calaway 1, Melissa C. Rodriguez 2, and Judith H. Allton[removed]Jacobs (ESCG) at NASA Johnson Space Center, Houston, TX (2)

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Source URL: curator.jsc.nasa.gov

Language: English - Date: 2013-09-16 21:16:11
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